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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Process Monitoring with Optical Fibers and Harsh Environment Sensors - Process monitoring during manufacturing of large-scale composite parts
Heider, Dirk, Eckel II, Douglas A., Don, Roderic C., Fink, Bruce K., Gillespie, Jr., John W., Marcus, Michael A., Wang, AnboVolume:
3538
Year:
1999
Language:
english
DOI:
10.1117/12.335753
File:
PDF, 2.23 MB
english, 1999