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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Subpixel edge detection for dimensional control by artificial vision

Truchetet, Frederic, Laligant, Olivier, Tobin, Jr., Kenneth W.
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Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380066
File:
PDF, 214 KB
english, 2000
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