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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Optical Security and Counterfeit Deterrence Techniques III - Design methodology of Dutch banknotes
de Heij, Hans A. M., van Renesse, Rudolf L., Vliegenthart, Willem A.Volume:
3973
Year:
2000
Language:
english
DOI:
10.1117/12.382177
File:
PDF, 3.01 MB
english, 2000