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SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Laser Radar Technology and Applications VI - Measurements of Stokes parameters of materials at 1064-nm and 532-nm wavelengths
Tan, Songxin, Narayanan, Ram M., Kalshoven, Jr., James E., Kamerman, Gary W.Volume:
4377
Year:
2001
Language:
english
DOI:
10.1117/12.440114
File:
PDF, 207 KB
english, 2001