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SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Intelligent Systems in Design and Manufacturing IV - Application of data mining in performance measures
Chan, Michael F. S., Chung, Walter W., Wong, Tai Sun, Gunasekaran, Angappa, Gopalakrishnan, BhaskaranVolume:
4565
Year:
2001
Language:
english
DOI:
10.1117/12.443115
File:
PDF, 346 KB
english, 2001