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SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Optomechatronic Systems II - Optical flow measurment on Boolean edge detection and Hough transform
Ahmad, Muhammad B., Rhee, Seung Hak, Choy, Ik Soo, Park, Jong-An, Choi, Tae-Sun, Cho, HyungsuckVolume:
4564
Year:
2001
Language:
english
DOI:
10.1117/12.444085
File:
PDF, 298 KB
english, 2001