SPIE Proceedings [SPIE International Symposium on Optical...

  • Main
  • SPIE Proceedings [SPIE International...

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] X-Ray Mirrors, Crystals, and Multilayers - Characterization of high-quality synthetic diamond crystals by μm-resolved x-ray diffractometry and topography

Hoszowska, Joanna, Freund, Andreas K., Ishikawa, Tetsuya, Sellschop, Jacques P., Rebak, M., Burns, R. C., Hansen, J. O., Welch, D. L., Hall, C. E., Freund, Andreas K., Ishikawa, Tetsuya, Khounsary, Al
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4501
Year:
2001
Language:
english
DOI:
10.1117/12.448483
File:
PDF, 1.51 MB
english, 2001
Conversion to is in progress
Conversion to is failed