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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] X-Ray Mirrors, Crystals, and Multilayers - Characterization of high-quality synthetic diamond crystals by μm-resolved x-ray diffractometry and topography
Hoszowska, Joanna, Freund, Andreas K., Ishikawa, Tetsuya, Sellschop, Jacques P., Rebak, M., Burns, R. C., Hansen, J. O., Welch, D. L., Hall, C. E., Freund, Andreas K., Ishikawa, Tetsuya, Khounsary, AlVolume:
4501
Year:
2001
Language:
english
DOI:
10.1117/12.448483
File:
PDF, 1.51 MB
english, 2001