SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Image Processing: Algorithms and Systems - Debris flow velocity estimation: a comparison between gradient-based method and cross-correlation method

Uddin, Mohammad S., Inaba, Hiroyuki, Yoshida, Yasuo, Itakura, Yasumasa, Dougherty, Edward R., Astola, Jaakko T., Egiazarian, Karen O.
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Volume:
4667
Year:
2002
Language:
english
DOI:
10.1117/12.467974
File:
PDF, 210 KB
english, 2002
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