SPIE Proceedings [SPIE NDE For Health Monitoring and Diagnostics - San Diego, CA (Sunday 17 March 2002)] Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems - Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor
Yamanaka, Kazushi, Irihama, Hiroshi, Tsuji, Toshihiro, Nakamoto, Keiichi, Meyendorf, Norbert, Baaklini, George Y., Michel, BerndVolume:
4703
Year:
2002
DOI:
10.1117/12.469611
File:
PDF, 724 KB
2002