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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Design and Testing - Research on Polarization Parameters Testing System
Mao, Caihong, Shu, Xiaowu, Liu, Chen, Mou, Xu-Dong, Yang, GuoGuang, Weng, Zhicheng, Sasian, Jose M., Wang, YongtianVolume:
4927
Year:
2002
Language:
english
DOI:
10.1117/12.471668
File:
PDF, 265 KB
english, 2002