SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Advantages of using the 223-nm compared with 193-nm radiation wavelength for ophthalmic applications
Bagayev, Sergei N., Razhev, Alexander M., Zhupikov, Andrey A., Kargapoltsev, Evgeny S., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484494
File:
PDF, 290 KB
english, 2002