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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Fast and ultrafast dissipation and fluctuations in two-dimensional channels for nitride and arsenide FETs
Matulionis, Arvydas, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.Volume:
5113
Year:
2003
Language:
english
DOI:
10.1117/12.488759
File:
PDF, 303 KB
english, 2003