![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Flicker noise characterization and modeling of MOSFETs for RF IC design
Cheng, Yuhua, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.Volume:
5113
Year:
2003
Language:
english
DOI:
10.1117/12.497094
File:
PDF, 1.02 MB
english, 2003