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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - Extended-field confocal imaging for 3D surface sensing

Cohen-Sabban, Joseph, Gaillard-Groleas, Jerome, Crepin, Pierre-Jean, Geyl, Roland, Rimmer, David, Wang, Lingli
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Volume:
5252
Year:
2004
Language:
english
DOI:
10.1117/12.513583
File:
PDF, 726 KB
english, 2004
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