SPIE Proceedings [SPIE Second International Symposium on...

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SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Thermal de-embedding procedure for cryogenic on-wafer high-frequency noise measurement

Delcourt, Sebastien, Danneville, Francois, Bonani, Fabrizio, Dambrine, Gilles, Bourzgui, Nourr Eddine, Deen, M. Jamal, Levinshtein, Michael E., Danneville, Francois, Laporte, Christophe, Fraysse, Jean
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Volume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.545997
File:
PDF, 296 KB
english, 2004
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