SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optical Diagnostics - Light scattering diagnostics for metal fatigue detection and life estimation
Buckner, Benjamin D., Hanssen, Leonard M., Farrell, Patrick V., Markov, Vladimir B., Earthman, James C.Volume:
5880
Year:
2005
Language:
english
DOI:
10.1117/12.617980
File:
PDF, 266 KB
english, 2005