SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Machine Vision Applications in Industrial Inspection XIV - Real-time detection of elliptic shapes for automated object recognition and object tracking
Teutsch, Christian, Berndt, Dirk, Trostmann, Erik, Weber, Michael, Meriaudeau, Fabrice, Niel, Kurt S.Volume:
6070
Year:
2006
Language:
english
DOI:
10.1117/12.642167
File:
PDF, 1.26 MB
english, 2006