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Structural inhomogeneity of Ge-doped amorphous SiO2 probed by photoluminescence lifetime measurements under synchrotron radiation
S. Agnello, G. Buscarino, M. Cannas, F. Messina, S. Grandi, A. MagistrisVolume:
4
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssc.200673779
File:
PDF, 195 KB
english, 2007