SPIE Proceedings [SPIE High-Power Laser Ablation 2006 - Taos, NM (Sunday 7 May 2006)] High-Power Laser Ablation VI - Laser annealing of implanted silicon carbide and Raman characterization
Zergioti, I., Phipps, Claude R., Kontos, A. G., Zekentes, K., Boutopoulos, C., Terzis, P., Raptis, Y. S.Volume:
6261
Year:
2006
Language:
english
DOI:
10.1117/12.669497
File:
PDF, 317 KB
english, 2006