![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA, USA (Sunday 28 January 2007)] Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII - The intermediate size direct detection detector for electron microscopy
Jin, Liang, Milazzo, Anna-Clare, Kleinfelder, Stuart, Li, Shengdong, Leblanc, Philippe, Duttweiler, Fred, Bouwer, James C., Peltier, Steve T., Ellisman, Mark, Xuong, Nguyen-HuuVolume:
6501
Year:
2007
Language:
english
DOI:
10.1117/12.704329
File:
PDF, 407 KB
english, 2007