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Site-selective studies of erbium ion defects in thermally grown silicon oxides
Z. Fleischman, V. Dierolf, Z. Dong, Y. Zhang, M. White, R. Pafchek, M. Webster, T. KochVolume:
4
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssc.200673823
File:
PDF, 246 KB
english, 2007