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SPIE Proceedings [SPIE International Congress on Optics and Optoelectronics - Prague, Czech Republic (Monday 16 April 2007)] Nonlinear Optics and Applications II - Measurement of thin films using slightly dispersive spectral interferometry
Chlebus, R., Hlubina, P., Ciprian, D., Lunacek, J., Bertolotti, MarioVolume:
6582
Year:
2007
Language:
english
DOI:
10.1117/12.722682
File:
PDF, 379 KB
english, 2007