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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Rock fracture image acquisition and analysis
Yang, Li, Wang, W., Zongpu, Jia, Chen, Yaolong, Kley, Ernst-Bernhard, Chen, Liwan, Li, RongbinVolume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.783561
File:
PDF, 543 KB
english, 2007