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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - A front-end ASIC design for non-uniformity correction
Shen, X., Sheng, Yunlong, Wang, Yongtian, Ding, R. J., Lin, J. M., Zeng, Lijiang, Liu, F.Volume:
7156
Year:
2008
Language:
english
DOI:
10.1117/12.806710
File:
PDF, 283 KB
english, 2008