SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Advances in X-Ray/EUV Optics and Components IV - Evaluation of data storage layer thickness best fitted for digital data read-out procedure from hard x-ray optical memory
Bezirganyan, Hakob P., Khounsary, Ali M., Morawe, Christian, Bezirganyan, Siranush E., Bezirganyan, Jr., Petros H., Goto, Shunji, Bezirganyan, Jr., Hayk H.Volume:
7448
Year:
2009
Language:
english
DOI:
10.1117/12.826034
File:
PDF, 6.42 MB
english, 2009