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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - Characterization of secondary phases in modified vertical Bridgman growth CZT
Duff, Martine C., James, Ralph B., Franks, Larry A., Lynn, Kelvin G., Jones, Kelly, Burger, Arnold, Dai, Zurong R., Bradley, John P., Teslich, NickVolume:
7449
Year:
2009
Language:
english
DOI:
10.1117/12.829290
File:
PDF, 5.18 MB
english, 2009