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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Study on CCD size detecting technology based on imaging
Zhang, Kun, Yang, Donglin, Zhao, Peng, Wang, Xiang-jun, Zhang, Guang-jun, Gu, Lei, Ai, Ke-congVolume:
7384
Year:
2009
Language:
english
DOI:
10.1117/12.834080
File:
PDF, 478 KB
english, 2009