Dislocation-induced deep levels in ELO InP revealed by point contact photocapacitance measurements
Yutaka Oyama, Toshihiro Kimura, Jun-ichi NishizawaVolume:
4
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssc.200674262
File:
PDF, 153 KB
english, 2007