SPIE Proceedings [SPIE Photomask and NGL Mask Technology...

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SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVII - Yokohama, Japan (Tuesday 13 April 2010)] Photomask and Next-Generation Lithography Mask Technology XVII - Improvement of KrF contact layer by inverse lithography technology with assist feature

Jun, Sungho, Hosono, Kunihiro, Shim, Yeon-Ah, Choi, Jaeyoung, Choi, Kwangsun, Han, Jae-won, Wang, Kechang, McCarthy, John, Xiao, Guangming, Dai, Grace, Son, DongHwan, Zhou, Xin, Cecil, Tom, Kim, David
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Volume:
7748
Year:
2010
Language:
english
DOI:
10.1117/12.868563
File:
PDF, 1.22 MB
english, 2010
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