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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Space Exploration Technologies and Applications - Automated detection and classification for craters based on geometric matching
Zarnecki, John C., Chen, Jian-qing, Cui, Ping-yuan, Nardell, Carl A., Shu, Rong, Cui, Hui-tao, Yang, Jianfeng, Zhang, YunhuaVolume:
8196
Year:
2011
Language:
english
DOI:
10.1117/12.901020
File:
PDF, 369 KB
english, 2011