![](/img/cover-not-exists.png)
Innovative electrochemical deep etching technique involving aluminum thermomigration
S. Kouassi, G. Gautier, L. Ventura, J. Semai, C. Boulmer-Leborgne, B. Morillon, M. RoyVolume:
4
Year:
2007
Language:
english
Pages:
5
DOI:
10.1002/pssc.200674416
File:
PDF, 359 KB
english, 2007