SPIE Proceedings [SPIE 1986 International Symposium/Innsbruck - Innsbruck, Austria (Tuesday 15 April 1986)] Thin Film Technologies II - Micro-/Ultramicro Hardness Measurements with Insulating Films
Pulker, H K., Salzmann, K, Reichert, C, Jacobsson, J. RolandVolume:
652
Year:
1986
Language:
english
DOI:
10.1117/12.938370
File:
PDF, 211 KB
english, 1986