SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Assessment of a dynamic reference material for calibration of full-field measurement systems
Hack, Erwin, Feligiotti, Mara, Davighi, Andrea, Whelan, Maurice, Wang, Weizhuo V., Patterson, Eann A., Doval, Ángel F., Trillo, CristinaVolume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.977950
File:
PDF, 6.21 MB
english, 2012