SPIE Proceedings [SPIE SPECKLE 2012: V International...

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SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Assessment of a dynamic reference material for calibration of full-field measurement systems

Hack, Erwin, Feligiotti, Mara, Davighi, Andrea, Whelan, Maurice, Wang, Weizhuo V., Patterson, Eann A., Doval, Ángel F., Trillo, Cristina
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Volume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.977950
File:
PDF, 6.21 MB
english, 2012
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