Ultra-High Resolution Nano-Characterisation and Analysis...

Journal of Nanoscience and Nanotechnology 2009 / 02 Vol. 9; Iss. 2

Ultra-High Resolution Nano-Characterisation and Analysis Using Advanced S/TEM

Hubert, Dominique H. W., Freitag, Bert, Stokes, Debbie J., Tang, Dong, Van Cappellen, Eric
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Volume:
9
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2009.c085
Date:
February, 2009
File:
PDF, 3.51 MB
english, 2009
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