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Investigation of defect levels in 6H-SiC single crystals
P. Kamiński, R. Kozłowski, M. Kozubal, M. Miczuga, M. Palczewska, M. G. Pawłowski, M. PawłowskiVolume:
4
Year:
2007
Language:
english
Pages:
5
DOI:
10.1002/pssc.200675471
File:
PDF, 245 KB
english, 2007