Electrical and microscopy analysis of dislocations in...

Electrical and microscopy analysis of dislocations in present generation devices

I. Mica, M. L. Polignano, O. Moreau, D. Codegoni, P. F. Prestini, P. Magni
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Volume:
4
Year:
2007
Language:
english
Pages:
5
DOI:
10.1002/pssc.200675478
File:
PDF, 216 KB
english, 2007
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