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New method for the determination of the defect profile in thin layers grown over a substrate
A. Zubiaga, J. A. García, F. Plazaola, F. Tuomisto, J. Zúñiga, V. Muñoz-SanjoséVolume:
4
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssc.200675733
File:
PDF, 90 KB
english, 2007