Identification of lattice defects in Cu thin films by...

Identification of lattice defects in Cu thin films by positron annihilation spectroscopy

Masataka Mizuno, Teruo Kihara, Hideki Araki, Yasuharu Shirai, Takashi Onishi
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Volume:
4
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssc.200675774
File:
PDF, 198 KB
english, 2007
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