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Spectroscopic ellipsometric study of Ge nanocrystals embedded in SiO2 using parametric models
P. Basa, P. Petrik, M. Fried, A. Dâna, A. Aydinli, S. Foss, T. G. FinstadVolume:
5
Year:
2008
Language:
english
Pages:
5
DOI:
10.1002/pssc.200777773
File:
PDF, 319 KB
english, 2008