GaN HEMT thermal behavior and implications for reliability...

physica status solidi (c) 2008 Vol. 5; Iss. 6

GaN HEMT thermal behavior and implications for reliability testing and analysis

Daniel S. Green, Bharath Vembu, David Hepper, Shawn R. Gibb, Daniel Jin, Rama Vetury, Jeffrey B. Shealy, L. Thomas Beechem, Samuel Graham
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Volume:
5
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssc.200778722
File:
PDF, 221 KB
english, 2008
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