Spectroscopic ellipsometry study of ZnO films grown on...

Spectroscopic ellipsometry study of ZnO films grown on silicon substrate

Keh-moh Lin, Keng-yu Chou, Po-ming Chen
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Volume:
5
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssc.200779265
File:
PDF, 300 KB
english, 2008
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