The effect of crystallization technology and gate insulator deposition method on the performance and reliability of polysilicon TFTs
Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. VoutsasVolume:
5
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssc.200780146
File:
PDF, 181 KB
english, 2008