2.3 nm barrier AlN/GaN HEMTs with insulated gates
David Deen, Tom Zimmermann, Yu Cao, Debdeep Jena, Huili Grace XingVolume:
5
Year:
2008
Language:
english
Pages:
3
DOI:
10.1002/pssc.200878749
File:
PDF, 219 KB
english, 2008