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Off-angle dependence of void formation and defect behavior in a -plane MOVPE-GaN on r -plane sapphire substrate
Noriyuki Kuwano, Atsuhito Fukushima, Yuta Kugiyama, Tetsuya Ezaki, Masahiro Minami, Masahiko Araki, Katsuyuki Hoshino, Kazuyuki TadatomoVolume:
6
Year:
2009
Language:
english
Pages:
1
DOI:
10.1002/pssc.200880884
File:
PDF, 717 KB
english, 2009