IR studies of oxygen-related and carbon-related defects in...

IR studies of oxygen-related and carbon-related defects in Sn-doped silicon

Charalampos A. Londos, Andreas Andrianakis, Dimitris Aliprantis, Efstratia N. Sgourou, Hidenori Ohyama
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Volume:
8
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/pssc.201000105
File:
PDF, 216 KB
english, 2011
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