IR studies of oxygen-related and carbon-related defects in Sn-doped silicon
Charalampos A. Londos, Andreas Andrianakis, Dimitris Aliprantis, Efstratia N. Sgourou, Hidenori OhyamaVolume:
8
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/pssc.201000105
File:
PDF, 216 KB
english, 2011