![](/img/cover-not-exists.png)
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Daniel Kropman, Tiit Kärner, Sergei Dolgov, Ivo Heinmaa, Tõnu Laas, Charalampos A. LondosVolume:
8
Year:
2011
Language:
english
Pages:
3
DOI:
10.1002/pssc.201000269
File:
PDF, 186 KB
english, 2011