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X-ray diffraction study of GaN grown on patterned substrates
S. Sintonen, M. Ali, P. T. Törmä, S. Suihkonen, P. Kostamo, O. Svensk, M. Sopanen, H. Lipsanen, C. Paulmann, T. O. TuomiVolume:
8
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/pssc.201000883
File:
PDF, 830 KB
english, 2011