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Reliability of T-gate AlGaN/GaN HEMTs
Shawn D. Burnham, Ross Bowen, Pete Willadsen, Hector Bracamontes, Paul Hashimoto, Ming Hu, Danny Wong, Mary Chen, Miroslav MicovicVolume:
8
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/pssc.201000916
File:
PDF, 304 KB
english, 2011