Spectroscopy and structural properties of amorphous and nanocrystalline silicon carbide thin films
Sylvain Halindintwali, D. Knoesen, B. A. Julies, C. J. Arendse, T. Muller, Régis Y. N. Gengler, P. Rudolf, P. H. M. van LoosdrechtVolume:
8
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/pssc.201084124
File:
PDF, 436 KB
english, 2011