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Comparative study on nano-scale III-V MOSFETs with various channel materials using quantum-corrected Monte Carlo simulation
Takahiro Homma, Kei Hasegawa, Hisanao Watanabe, Shinsuke Hara, Hiroki I. FujishiroVolume:
9
Year:
2012
Language:
english
Pages:
4
DOI:
10.1002/pssc.201100275
File:
PDF, 391 KB
english, 2012